YieldPilot monitors your fab's process data in real-time and uses AI to catch yield-killing anomalies before they reach the wafer. No new equipment. Just smarter data.
Try the Dashboard →Most fabs sit on terabytes of sensor data. YieldPilot turns it into yield.
ML models trained on your process history identify drift patterns and flag anomalies before wafers reach inspection, cutting scrap rates by catching problems at the source.
AI continuously analyzes the relationship between deposition, etch, and litho parameters and final yield, recommending optimal settings for every recipe and chamber.
Connect your existing OPC, SECS/GEM, or CSV data feeds. YieldPilot ingests process, metrology, and equipment data without requiring new hardware installation.
Track yield trends, root cause analysis, and projected savings in one place. Every insight ties back to dollars saved, not just statistical noise.
Upload historical process logs, sensor feeds, or connect directly to your MES/FDC system. CSV, API, or real-time streaming.
YieldPilot trains on your specific recipes, chambers, and yield history. No generic models. Your fab, your physics, your predictions.
Get real-time alerts when process drift is detected. See exactly which parameter is drifting and what to adjust. Track yield improvement over time.
Every percentage point of yield improvement is worth millions. YieldPilot makes that accessible to every fab, not just the ones that can afford $10M inspection systems.